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IRDiO [IL, RL, Detection in One]

IRDiO Series

 IRDiO is based on TD (Time-Domain) OCT technology utilizing a Michelson interferometer. By leveraging the unique characteristics of this interferometer, it can not only measure reflection loss (RL) with high sensitivity but also simultaneously acquire distance information up to the point where reflection occurs. Since its launch in 2016, the OCCR series has been recognized as a long-selling product for Micro crack checking. A new feature, “Insertion Loss (IL) Measurement,” has now been added. This all-in-one tool measures three parameters—IL (Insertion Loss), RL (Retern Loss), and Micro Crack detection (Detect)—with just one connector connection and a single click. 
 IRDiO is highly effective for optical characteristic inspection of silicon photonics (SiPh) devices and chip-level evaluation during development. Its extremely low second peak (noise peak) and clear measurement waveforms make it easy to distinguish the real peak, ensuring accurate evaluation results. This characteristic enables stable data acquisition even for SiPh products with complex optical circuits.

Wave Guide

IRDiO Premium

Sharp Reflection Peaks

IRDiO Apex

Silicon Photonics

Multi Unit
Expander Unit
OPM Unit

equipment 01 p01

【Features】

Low Spurious × Sharp Reflection Peaks
The OLCR method achieves sharp waveforms with minimal spread at the waveform tail. It also clearly visualizes minute reflections and closely spaced events. Provides high-precision support for research and development of optical waveguides and silicon photonics devices.

    Versatile Options
  • ・OPM Unit: Simultaneously measures reflection attenuation and insertion loss
  • ・Multi Unit: Multi-core measurement up to 24 channels
  • ・Expander Unit: Distance extension
【Specification】
Premium/Apex
Feature Specifications
Model Premium Apex
Measurement wavelength JP131:1310nm(Main)
JP155:1550nm(Main)
JP135:1310nm(Main)/1550nm( Sub)
JP153:1550nm(Main)/1310nm( Sub)
JA131:1310nm(Main)
JA155:1550nm(Main)
JA135:1310nm(Main)/1550nm(Sub)
JA155:1550nm(Main)/1310nm(Sub)
Measurement distance range 1 100mm 1000mm
Distance sampling resolution

1
1, 4, 8 µm
Spatial resolution 2、3 40 µm or less
Distance measurement 
reproducibility

4、6
50 µm or less
Back reflection measurement 
range
Normal Range:-14.7 〜- 85 dB
High Sensitivity Range:-50〜-100 dB
Normal Range   :- 14.7 〜- 80 dB
High Sensitivity Range:-50 〜-100 dB
Back reflection measurement
range uncertainty

2、5、6、7
Normal Range:±3dB(- 14.7〜- 85 dB)
High Sensitivity Range:±3 dB(-50〜-90dB)
±5dB(-90〜-100 dB)
Normal Range:±3dB(- 14.7〜- 80 dB)
High Sensitivity Range:±3dB (-50〜-90dB)
±5dB (-90〜-100 dB)
Spurious noise 8 Normal Range :- 85dB or less 9
High Sensitivity Range:-100 dB or less 10
Normal Range :- 80dB or less 9
High Sensitivity Range:-100 dB or less 10
Measurement time 11 Approx. 6 s or more Approx. 13 s or more
Dimensions and mass 430(W)× 132(H) × 350(D) mm
(excluding protrusions), Approx. 8kg
427 (W) × 188(H) × 492 (D) mm
(excluding protrusions), Approx. 22kg
Applicable optical fiber SMF(ITU-TG.652)

After warm-up. Main wavelength specifications given.
1 :Refractive index 1.467 (from the end of the attached optical fiber
2 :Value at 0 mm from the OUT end of the master cord
3 :Half width of reflected optical peak waveform
4 :Air-conditioned indoor temperature 23°C to 24°C, stability mode on, excluding the effects of temperature-induced expansion of optical fibers
5 :RL values can vary by up to approx. 3 dB by moving the fiber.
6 :2σ
7 :Averaging once (–14.7 dB to –90 dB), 5 times if less than –90 dB
8 :Spurious waveforms caused by device-specific characteristics
9 :Measuring spurious noise level -14.7 dB (0 mm position), averaging 5 times
10:Measuring spurious noise level -50 dB (0 mm position), averaging 5 times
11:Measurement distance range 100 mm, distance measurement sample resolution 8 µm, high sensitivity range: –50 to –100 dB, averaging once, varies depending on PC operating environment

OPM Unit
Feature Specifications
Measurement wavelength 1310 nm/1550 nm1
Loss measurement range 0 to 10 dB
Loss measurement uncertainty

2、3
± 0.02 dB
Applicable optical fiber SMF(ITU-TG.652)
Connector adapter FC or SC
* LC connector, 2.5 mm ferrule, 1.25 mm ferrule, MT connector, MPO connector, 
and fiber folder types sold separately
Dimensions and mass 60(W)x45(H)x100(D)mm (excluding protrusions), approx. 0.4 kg

After warm-up. Main wavelength specifications given.
1:Same as the measured wavelength of the Premium/Apex
2:2 σ
3:Within 5 minutes after reference measurement, temperature change ±1 °C or less

Multi Unit
Feature Specifications
Number of channels Up to 24 channels
Channel switching time Approx. 2 s 
Insertion loss 1 2.6 dB or less
CH switching repeatability

2, 3, 4
± 0.02 dB
Measurement target optical fiber 10/125μm single mode (SM)
Fiber count Up to 24
Optical connector Test port: FC/APC 
Output port: LC/APC
Applicable optical fiber SMF (ITU-T G.652)
Dimensions and mass 200(W)x132(H)x350(D)mm (excluding protrusions), approx. 約 3 kg

After warm-up. Main wavelength specifications given. 
1:When Multi Unit is used, measurement sensitivity may decrease by 2.6 dB
2:Repeatability of IL measurement when used in combination with Premium/Apex and OPM Unit
3:±2σ
4:When the ambient temperature is within ±1°C of the reference point

Expander Unit
Feature Specifications
Number of Channels1 Up to 8 channels
Channel switching time Approx. 2 s  
Insertion loss 2 4.8 dB or less
CH switching repeatability 3 ± 0.04 dB
Dimensions and mass 200 (W)x132(H)x350(D)mm (excluding protrusions), approx. 約 3 kg

1:CH1 fixed from 0 to 1000 mm
2:When Expander Unit is used, measurement sensitivity may decrease by 4.8 dB
3:±2σ


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